Test and Qualification

• Capital Semiconductor can test a wide range of products from complex analog parts, lasers and photo detectors including silicon carbide (SiC) and GaN power devices. Capital Semiconductors experienced team of test engineers can support first debug to high volume production for a wide range of device technologies from analog, mixed signal and in both at wafer and final package level.

Capital Semiconductors provides stress based reliability qualification services to semiconductor manufacturers, military, aerospace and OEM’s. Our experienced Reliability Engineers can create qualification plans and perform testing to meet your requirements with strict adherence to applicable JEDEC and MIL-STD-883, MIL-STD-750, MIL-STD-202, JEDEC, AEC-Q100/Q200 and TELCORDIA specifications.

Capital Semiconductors provides parametric characterization for a wide range of passive devices and discrete components. Experience engineering staff of Capital Semiconductor can also develop device characterization and ATE testing of small-scale integrated circuits upon request.